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1 Ergebnisse
1
Characterization of trap-related transient-current effects ..:
, In:
2023 International Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits (INMMIC)
,
Sanchez-Martin, H.
;
Iniguez-de-la-Torre, I.
;
Mateos, J.
... - p. 1-4 , 2023
Link:
https://doi.org/10.1109/INMMIC57329.2023.10321782
RT T1
2023 International Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits (INMMIC)
: T1
Characterization of trap-related transient-current effects in AlGaN/GaN nanochannels
UL https://suche.suub.uni-bremen.de/peid=ieee-10321782&Exemplar=1&LAN=DE A1 Sanchez-Martin, H. A1 Iniguez-de-la-Torre, I. A1 Mateos, J. A1 Perez, S. A1 Gonzalez, T. A1 Nunes, Luis C. A1 Pedro, Jose C. YR 2023 SN 2689-5498 K1 Temperature K1 Current-voltage characteristics K1 Voltage K1 Microwave circuits K1 Nanoscale devices K1 Etching K1 Wide band gap semiconductors K1 GaN K1 Nanochannels K1 Trapping effects SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/INMMIC57329.2023.10321782 DO https://doi.org/10.1109/INMMIC57329.2023.10321782 SF ELIB - SuUB Bremen
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