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1 Ergebnisse
1
Responsivity Measurements up to 110 GHz Using AlGaN/GaN HEM..:
, In:
2023 International Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits (INMMIC)
,
Iniguez-de-la-Torre, I.
;
Artillan, Philippe
;
Paz-Martinez, Gaudencio
... - p. 1-3 , 2023
Link:
https://doi.org/10.1109/INMMIC57329.2023.10321787
RT T1
2023 International Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits (INMMIC)
: T1
Responsivity Measurements up to 110 GHz Using AlGaN/GaN HEMTs with Different Gate Size
UL https://suche.suub.uni-bremen.de/peid=ieee-10321787&Exemplar=1&LAN=DE A1 Iniguez-de-la-Torre, I. A1 Artillan, Philippe A1 Paz-Martinez, Gaudencio A1 Rochefeuille, Edouard A1 Gonzalez, T. A1 Mateos, J. YR 2023 SN 2689-5498 K1 Microwave measurement K1 Couplings K1 Power measurement K1 Detectors K1 Logic gates K1 HEMTs K1 Microwave circuits K1 Device physics K1 GaN high electron mobility transistors (HEMTs) K1 Radio frequency detection K1 Zero-bias detector SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/INMMIC57329.2023.10321787 DO https://doi.org/10.1109/INMMIC57329.2023.10321787 SF ELIB - SuUB Bremen
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