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Soft Error Immune with Enhanced Critical Charge SIC14T SRAM..:

, In: 2023 IFIP/IEEE 31st International Conference on Very Large Scale Integration (VLSI-SoC),
Ahmed, Sagheer ; Ambulkar, Jayesh ; Mondal, Debabrata. - p. 1-6 , 2023
Link: https://doi.org/10.1109/VLSI-SoC57769.2023.10321888