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Enhanced three-dimensional reconstruction by photometric st..:

, In: 2023 5th International Conference on Pattern Analysis and Intelligent Systems (PAIS),
Abada, Lyes ; Hannachi, Islam ; Laallam, Mohamed Wail. - p. 1-5 , 2023
Link: https://doi.org/10.1109/PAIS60821.2023.10322023