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1 Ergebnisse
1
Methodology for Evaluating 2DEG Carrier Behavior in High-Fr..:
, In:
TENCON 2023 - 2023 IEEE Region 10 Conference (TENCON)
,
Shimizu, Yuki
;
Fujiwara, Atsuya
;
Hayashi, Haruki
... - p. 570-574 , 2023
Link:
https://doi.org/10.1109/TENCON58879.2023.10322353
RT T1
TENCON 2023 - 2023 IEEE Region 10 Conference (TENCON)
: T1
Methodology for Evaluating 2DEG Carrier Behavior in High-Frequency Bands in AlGaN/GaN HEMTs
UL https://suche.suub.uni-bremen.de/peid=ieee-10322353&Exemplar=1&LAN=DE A1 Shimizu, Yuki A1 Fujiwara, Atsuya A1 Hayashi, Haruki A1 Sano, Soichi A1 Hirana, Kazuaki A1 Taguchi, Hirohisa YR 2023 SN 2159-3450 K1 Temperature measurement K1 Frequency dependence K1 Voltage measurement K1 Crystals K1 HEMTs K1 Behavioral sciences K1 Wide band gap semiconductors K1 AlGaN/GaN HEMTs K1 oscillation waveform K1 2DEG carrier behavior SP 570 OP 574 LK http://dx.doi.org/https://doi.org/10.1109/TENCON58879.2023.10322353 DO https://doi.org/10.1109/TENCON58879.2023.10322353 SF ELIB - SuUB Bremen
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