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1 Ergebnisse
1
Low-Cost, Robust Data Acquisition System for Automotive Tes..:
, In:
TENCON 2023 - 2023 IEEE Region 10 Conference (TENCON)
,
Kumar Reddy, P Kiran
;
A, Rashmi
;
V, Adarsha B
. - p. 612-616 , 2023
Link:
https://doi.org/10.1109/TENCON58879.2023.10322392
RT T1
TENCON 2023 - 2023 IEEE Region 10 Conference (TENCON)
: T1
Low-Cost, Robust Data Acquisition System for Automotive Testing and Validation Using LabVIEW
UL https://suche.suub.uni-bremen.de/peid=ieee-10322392&Exemplar=1&LAN=DE A1 Kumar Reddy, P Kiran A1 A, Rashmi A1 V, Adarsha B A1 M, Govinda Raju YR 2023 SN 2159-3450 K1 Industries K1 Voltage measurement K1 Microcontrollers K1 Data acquisition K1 Voltage control K1 Probes K1 Testing K1 Data Acquisition K1 LabVIEW K1 Arduino K1 CAN communication K1 Automotive Industry SP 612 OP 616 LK http://dx.doi.org/https://doi.org/10.1109/TENCON58879.2023.10322392 DO https://doi.org/10.1109/TENCON58879.2023.10322392 SF ELIB - SuUB Bremen
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