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1 Ergebnisse
1
Local Layout Effect-Aware Static Timing Analysis by use of ..:
, In:
2023 IEEE/ACM International Conference on Computer Aided Design (ICCAD)
,
Kim, Juyeon
;
Han, Changho
;
Bae, Cheoljun
... - p. 1-6 , 2023
Link:
https://doi.org/10.1109/ICCAD57390.2023.10323683
RT T1
2023 IEEE/ACM International Conference on Computer Aided Design (ICCAD)
: T1
Local Layout Effect-Aware Static Timing Analysis by use of a New Sensitivity-Based Library
UL https://suche.suub.uni-bremen.de/peid=ieee-10323683&Exemplar=1&LAN=DE A1 Kim, Juyeon A1 Han, Changho A1 Bae, Cheoljun A1 Kim, Yoobeom A1 Kim, Jae Hoon A1 Seo, Hyun-Seung YR 2023 SN 1558-2434 K1 Sensitivity K1 Costs K1 Layout K1 Libraries K1 Threshold voltage K1 Timing K1 Delays K1 local layout effect K1 layout dependent effect K1 static timing analysis K1 RX width transition K1 delay sensitivity library SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/ICCAD57390.2023.10323683 DO https://doi.org/10.1109/ICCAD57390.2023.10323683 SF ELIB - SuUB Bremen
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