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1 Ergebnisse
1
Thermal Transient Tests with Programmed Powering on Wide Ba..:
, In:
2023 29th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)
,
Ress, Sandor
;
Sarkany, Zoltan
;
Rencz, Marta
. - p. 1-8 , 2023
Link:
https://doi.org/10.1109/THERMINIC60375.2023.10325869
RT T1 <cTitle>2023 29th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)</cTitle>: T1 <Title>Thermal Transient Tests with Programmed Powering on Wide Bandgap Power Devices of Non-Monotonous and Time-Variant Characteristics</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10325869&Exemplar=1&LAN=DE A1 Ress, Sandor A1 Sarkany, Zoltan A1 Rencz, Marta A1 Farkas, Gabor YR 2023 SN 2474-1523 K1 Temperature measurement K1 Semiconductor device measurement K1 Voltage measurement K1 Photonic band gap K1 Current measurement K1 Distortion K1 Pins K1 wide-band-gap semiconductors K1 thermal transient testing K1 reliability testing K1 MOSFET K1 high power SP 1 OP 8 LK http://dx.doi.org/https://doi.org/10.1109/THERMINIC60375.2023.10325869 DO https://doi.org/10.1109/THERMINIC60375.2023.10325869 SF ELIB - SuUB Bremen
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