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The minimal set of IVL measurements to characterize power L..:
, In:
2023 29th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)
,
Nemeth, Marton
;
Hantos, Gusztav
;
Hegedus, Janos
- p. 1-6 , 2023
Link:
https://doi.org/10.1109/THERMINIC60375.2023.10325902
RT T1
2023 29th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)
: T1
The minimal set of IVL measurements to characterize power LED chips
UL https://suche.suub.uni-bremen.de/peid=ieee-10325902&Exemplar=1&LAN=DE A1 Nemeth, Marton A1 Hantos, Gusztav A1 Hegedus, Janos YR 2023 SN 2474-1523 K1 Temperature measurement K1 Semiconductor device measurement K1 Power measurement K1 Voltage measurement K1 Current measurement K1 Measurement uncertainty K1 Light emitting diodes K1 LED K1 parameter extraction K1 IVL measurements K1 digital twin SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/THERMINIC60375.2023.10325902 DO https://doi.org/10.1109/THERMINIC60375.2023.10325902 SF ELIB - SuUB Bremen
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