I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
A Simple and Effective Power Derating Strategy Based on Jun..:
, In:
2023 29th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)
,
Lamanuzzi, Andrea
;
Tranchero, Maurizio
;
Pastore, Andrea
.. - p. 1-4 , 2023
Link:
https://doi.org/10.1109/THERMINIC60375.2023.10325912
RT T1 <cTitle>2023 29th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)</cTitle>: T1 <Title>A Simple and Effective Power Derating Strategy Based on Junction Temperature Estimation Improving Both Performance and Reliability</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10325912&Exemplar=1&LAN=DE A1 Lamanuzzi, Andrea A1 Tranchero, Maurizio A1 Pastore, Andrea A1 Romano, Claudio A1 Santero, Paolo YR 2023 SN 2474-1523 K1 Temperature sensors K1 Temperature measurement K1 Temperature distribution K1 Estimation K1 Real-time systems K1 Behavioral sciences K1 Reliability K1 Real-time junction temperature estimation K1 component de-rating K1 performance K1 transistor reliability SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/THERMINIC60375.2023.10325912 DO https://doi.org/10.1109/THERMINIC60375.2023.10325912 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
