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Automatic evaluation of cracks with semantic segmentation m..:

, In: 2023 IEEE XXX International Conference on Electronics, Electrical Engineering and Computing (INTERCON),
Velasquez, Ricardo Arias ; Vanessa Mejia Lara, Jennifer ; Velasquez, Renato Arias - p. 1-7 , 2023
Link: https://doi.org/10.1109/INTERCON59652.2023.10326087