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1 Ergebnisse
1
Maturity model for data leakage security protocols in telec..:
, In:
2023 IEEE XXX International Conference on Electronics, Electrical Engineering and Computing (INTERCON)
,
Leon, Solis
;
Joel, Brian
;
Jara, Di Paola
... - p. 1-6 , 2023
Link:
https://doi.org/10.1109/INTERCON59652.2023.10326098
RT T1 <cTitle>2023 IEEE XXX International Conference on Electronics, Electrical Engineering and Computing (INTERCON)</cTitle>: T1 <Title>Maturity model for data leakage security protocols in telecommunications companies applying the NIST framework</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10326098&Exemplar=1&LAN=DE A1 Leon, Solis A1 Joel, Brian A1 Jara, Di Paola A1 Giovanni, Renzo A1 Cornejo, Copaja A1 Nivaldo, Richard YR 2023 K1 Electrical engineering K1 Solid modeling K1 Protocols K1 Information security K1 Companies K1 NIST K1 Solids K1 maturity model K1 response protocols K1 evaluation SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/INTERCON59652.2023.10326098 DO https://doi.org/10.1109/INTERCON59652.2023.10326098 SF ELIB - SuUB Bremen
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