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1 Ergebnisse
1
Mask CycleGAN for removing artifacts in dual-energy CT:
, In:
2023 IEEE International Conference on Consumer Electronics-Asia (ICCE-Asia)
,
Park, Chunsu
;
Lee, DongEon
;
Kim, Seonho
.. - p. 1-4 , 2023
Link:
https://doi.org/10.1109/ICCE-Asia59966.2023.10326389
RT T1 <cTitle>2023 IEEE International Conference on Consumer Electronics-Asia (ICCE-Asia)</cTitle>: T1 <Title>Mask CycleGAN for removing artifacts in dual-energy CT</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10326389&Exemplar=1&LAN=DE A1 Park, Chunsu A1 Lee, DongEon A1 Kim, Seonho A1 Lee, SiYeoul A1 Kim, MinWoo YR 2023 K1 Deep learning K1 Training K1 Electric potential K1 Computed tomography K1 Magnetic resonance K1 Imaging K1 Computer architecture K1 CycleGAN K1 Artifacts K1 Bone marrow edema K1 Dual-energy CT SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ICCE-Asia59966.2023.10326389 DO https://doi.org/10.1109/ICCE-Asia59966.2023.10326389 SF ELIB - SuUB Bremen
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