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1 Ergebnisse
1
Test Selection Design with Unreliable Tests Based on Bayesi..:
, In:
2023 35th Chinese Control and Decision Conference (CCDC)
,
Li, Yang
;
Huang, Dandan
;
Lu, Ningyun
.. - p. 37-43 , 2023
Link:
https://doi.org/10.1109/CCDC58219.2023.10326601
RT T1
2023 35th Chinese Control and Decision Conference (CCDC)
: T1
Test Selection Design with Unreliable Tests Based on Bayesian Network and SA-GA
UL https://suche.suub.uni-bremen.de/peid=ieee-10326601&Exemplar=1&LAN=DE A1 Li, Yang A1 Huang, Dandan A1 Lu, Ningyun A1 Jia, Li A1 Jiang, Bin YR 2023 SN 1948-9447 K1 Fault diagnosis K1 Costs K1 Uncertainty K1 Fault detection K1 Automatic generation control K1 Simulated annealing K1 Bayes methods K1 Fault detection and diagnosis K1 optimal test selection K1 expectation-maximization K1 Bayesian network K1 Automatic Gauge Control (AGC) SP 37 OP 43 LK http://dx.doi.org/https://doi.org/10.1109/CCDC58219.2023.10326601 DO https://doi.org/10.1109/CCDC58219.2023.10326601 SF ELIB - SuUB Bremen
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