I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
NBTI Defects Characterization Using Energy Profiling Simula..:
, In:
2023 IEEE Regional Symposium on Micro and Nanoelectronics (RSM)
,
Hussin, Hanim
;
Wan, Sharifah Fatmadiana
;
Soin, Norhayati
... - p. 50-53 , 2023
Link:
https://doi.org/10.1109/RSM59033.2023.10326770
RT T1 <cTitle>2023 IEEE Regional Symposium on Micro and Nanoelectronics (RSM)</cTitle>: T1 <Title>NBTI Defects Characterization Using Energy Profiling Simulation Technique</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10326770&Exemplar=1&LAN=DE A1 Hussin, Hanim A1 Wan, Sharifah Fatmadiana A1 Soin, Norhayati A1 Wahab, Yasmin Abdul A1 Muhamad, Maizan A1 Alias, Nurul Ezaila YR 2023 SN 2639-4642 K1 Negative bias temperature instability K1 Photonic band gap K1 Thermal variables control K1 Simulation K1 Fermi level K1 Voltage K1 Numerical simulation K1 NBTI K1 p-MOSFET K1 positively charged defect K1 energy profiling K1 reliability component SP 50 OP 53 LK http://dx.doi.org/https://doi.org/10.1109/RSM59033.2023.10326770 DO https://doi.org/10.1109/RSM59033.2023.10326770 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
