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1 Ergebnisse
1
Analysis of Influence of Various Defects on the Electric Fi..:
, In:
2023 International Symposium on Electrical Insulating Materials (ISEIM)
,
Kong, Xiaoxiao
;
Hou, Chengyao
;
Yun, Chen
... - p. 332-335 , 2023
Link:
https://doi.org/10.23919/ISEIM60444.2023.10329003
RT T1 <cTitle>2023 International Symposium on Electrical Insulating Materials (ISEIM)</cTitle>: T1 <Title>Analysis of Influence of Various Defects on the Electric Field and Mechanical Stress Distribution of Insulation Rod</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10329003&Exemplar=1&LAN=DE A1 Kong, Xiaoxiao A1 Hou, Chengyao A1 Yun, Chen A1 Wang, Yifang A1 Xue, Rundong A1 Boxue, Du YR 2023 K1 Insulation K1 Tensile stress K1 Simulation K1 Fitting K1 Metals K1 High-voltage techniques K1 Distortion K1 GIS Circuit Breaker K1 Insulation rod K1 Internal defects K1 Electrical field K1 Mechanical stress field distribution SP 332 OP 335 LK http://dx.doi.org/https://doi.org/10.23919/ISEIM60444.2023.10329003 DO https://doi.org/10.23919/ISEIM60444.2023.10329003 SF ELIB - SuUB Bremen
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