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1 Ergebnisse
1
Investigation on peak reverse recovery current for junction..:
, In:
2022 Annual Meeting of CSEE Study Committee of HVDC and Power Electronics (HVDC 2022)
,
Jiao, Q.
;
Zhu, L.
;
Zhan, C.
... - p. None , 2022
Link:
https://doi.org/10.1049/icp.2023.0152
RT T1 <cTitle>2022 Annual Meeting of CSEE Study Committee of HVDC and Power Electronics (HVDC 2022)</cTitle>: T1 <Title>Investigation on peak reverse recovery current for junction temperature estimation of FWD</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10329556&Exemplar=1&LAN=DE A1 Jiao, Q. A1 Zhu, L. A1 Zhan, C. A1 Zhang, Y. A1 Liu, Z. A1 Wang, W. A1 Yu, K. A1 Ji, S. YR 2022 K1 insulated gate bipolar transistors K1 integrated circuit modelling K1 power integrated circuits K1 semiconductor diodes K1 semiconductor junctions K1 thermal management (packaging) K1 condition monitoring K1 freewheeling diode chips K1 FWD chips K1 high voltage power modules K1 junction temperature estimation K1 lifetime prediction K1 multiIGBT chips K1 peak current detector K1 peak reverse recovery current model K1 thermal management SP None LK http://dx.doi.org/https://doi.org/10.1049/icp.2023.0152 DO https://doi.org/10.1049/icp.2023.0152 SF ELIB - SuUB Bremen
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