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1 Ergebnisse
1
GENSS: Defect Classification Method on Extremely Small Data..:
, In:
2023 27th International Computer Science and Engineering Conference (ICSEC)
,
Yuen, Shang Li
;
Wong, Chin Wee
;
Lau, Phooi Yee
... - p. 419-424 , 2023
Link:
https://doi.org/10.1109/ICSEC59635.2023.10329633
RT T1 <cTitle>2023 27th International Computer Science and Engineering Conference (ICSEC)</cTitle>: T1 <Title>GENSS: Defect Classification Method on Extremely Small Datasets for Semiconductor Manufacturing</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10329633&Exemplar=1&LAN=DE A1 Yuen, Shang Li A1 Wong, Chin Wee A1 Lau, Phooi Yee A1 Hussin, Zarina A1 Kamarudin, Nur Afiqah A1 Samsuri, Muhammad Hafiz A1 Talib, Muhammad Syukri Mohd A1 Hon, Hock Woon YR 2023 SN 2768-0592 K1 Training K1 Industries K1 Fixtures K1 Transfer learning K1 Inspection K1 Semiconductor device manufacture K1 Manufacturing K1 small dataset K1 augmentation K1 structural similarity K1 image hashing K1 synthetic data SP 419 OP 424 LK http://dx.doi.org/https://doi.org/10.1109/ICSEC59635.2023.10329633 DO https://doi.org/10.1109/ICSEC59635.2023.10329633 SF ELIB - SuUB Bremen
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