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1 Ergebnisse
1
Built in Self Test on Random Test Pattern Generation for Te..:
, In:
2023 International Conference on Self Sustainable Artificial Intelligence Systems (ICSSAS)
,
Ravi, R.
;
Kannadhasan, S.
;
Ramachandran, K.
... - p. 1618-1621 , 2023
Link:
https://doi.org/10.1109/ICSSAS57918.2023.10331724
RT T1
2023 International Conference on Self Sustainable Artificial Intelligence Systems (ICSSAS)
: T1
Built in Self Test on Random Test Pattern Generation for Test Compression
UL https://suche.suub.uni-bremen.de/peid=ieee-10331724&Exemplar=1&LAN=DE A1 Ravi, R. A1 Kannadhasan, S. A1 Ramachandran, K. A1 Deepa, K. A1 Thabathi, R. A1 Kalaivani, S. YR 2023 K1 Integrated circuits K1 Power demand K1 Switches K1 Built-in self-test K1 Test pattern generators K1 Artificial intelligence K1 RTPG K1 MISR K1 PRPG K1 ATE K1 BIST K1 DFT SP 1618 OP 1621 LK http://dx.doi.org/https://doi.org/10.1109/ICSSAS57918.2023.10331724 DO https://doi.org/10.1109/ICSSAS57918.2023.10331724 SF ELIB - SuUB Bremen
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