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1 Ergebnisse
1
An Improved YOLOv8 Network for Photosensitive Element Defec..:
, In:
2023 IEEE 6th International Conference on Pattern Recognition and Artificial Intelligence (PRAI)
,
Ye, Wenjin
;
Yue, Hongwei
;
Kou, Kit Ian
... - p. 290-298 , 2023
Link:
https://doi.org/10.1109/PRAI59366.2023.10331951
RT T1 <cTitle>2023 IEEE 6th International Conference on Pattern Recognition and Artificial Intelligence (PRAI)</cTitle>: T1 <Title>An Improved YOLOv8 Network for Photosensitive Element Defect Detection</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10331951&Exemplar=1&LAN=DE A1 Ye, Wenjin A1 Yue, Hongwei A1 Kou, Kit Ian A1 Gao, Hongchao A1 Yu, Mingqi A1 Chen, Chuangquan YR 2023 K1 Image quality K1 Convolution K1 Object detection K1 Production K1 Interference K1 Feature extraction K1 Data mining K1 YOLOV8 K1 photosensitive elements K1 defect detection K1 small target detection K1 attention SP 290 OP 298 LK http://dx.doi.org/https://doi.org/10.1109/PRAI59366.2023.10331951 DO https://doi.org/10.1109/PRAI59366.2023.10331951 SF ELIB - SuUB Bremen
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