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1 Ergebnisse
1
Comparative Analysis of Three Generations of LYSO:Ce Crysta..:
, In:
2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)
,
Wehr, J.
;
van Blaaderen, J. J.
;
Rasch, C. R.N.
. - p. 1-1 , 2023
Link:
https://doi.org/10.1109/NSSMICRTSD49126.2023.10337838
RT T1
2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)
: T1
Comparative Analysis of Three Generations of LYSO:Ce Crystals for Medical Imaging Applications
UL https://suche.suub.uni-bremen.de/peid=ieee-10337838&Exemplar=1&LAN=DE A1 Wehr, J. A1 van Blaaderen, J. J. A1 Rasch, C. R.N. A1 Schaart, D. R. YR 2023 SN 2577-0829 K1 Temperature measurement K1 Semiconductor device measurement K1 Temperature K1 Scintillators K1 Semiconductor detectors K1 Crystals K1 Cathode ray tubes SP 1 OP 1 LK http://dx.doi.org/https://doi.org/10.1109/NSSMICRTSD49126.2023.10337838 DO https://doi.org/10.1109/NSSMICRTSD49126.2023.10337838 SF ELIB - SuUB Bremen
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