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1 Ergebnisse
1
A Depth-encoding Technique for the Biograph Vision PET/CT S..:
, In:
2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)
,
Teimoorisichani, M.
;
Cho, S.
;
Sharghi, V. Khalilzad
... - p. 1-1 , 2023
Link:
https://doi.org/10.1109/NSSMICRTSD49126.2023.10337855
RT T1 <cTitle>2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)</cTitle>: T1 <Title>A Depth-encoding Technique for the Biograph Vision PET/CT Scanner</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10337855&Exemplar=1&LAN=DE A1 Teimoorisichani, M. A1 Cho, S. A1 Sharghi, V. Khalilzad A1 Judenhofer, M. A1 Cabello, J. A1 Panin, V. A1 Aykac, M. A1 Conti, M. YR 2023 SN 2577-0829 K1 Training K1 Semiconductor device measurement K1 Monte Carlo methods K1 Biographies K1 Semiconductor detectors K1 Phantoms K1 Detectors SP 1 OP 1 LK http://dx.doi.org/https://doi.org/10.1109/NSSMICRTSD49126.2023.10337855 DO https://doi.org/10.1109/NSSMICRTSD49126.2023.10337855 SF ELIB - SuUB Bremen
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