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1
Data Acquisition Methods for SiPM Characterization: Current..:
, In:
2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)
,
Henriksson-Ward, M.
;
Mahtab, M.
;
Retiere, F.
... - p. 1-1 , 2023
Link:
https://doi.org/10.1109/NSSMICRTSD49126.2023.10337858
RT T1 <cTitle>2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)</cTitle>: T1 <Title>Data Acquisition Methods for SiPM Characterization: Current Status of the VERA System at TRIUMF</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10337858&Exemplar=1&LAN=DE A1 Henriksson-Ward, M. A1 Mahtab, M. A1 Retiere, F. A1 Capra, A. A1 Massacret, N. A1 Gallina, G. A1 Margetak, P. YR 2023 SN 2577-0829 K1 Semiconductor device measurement K1 Vacuum systems K1 Semiconductor detectors K1 Current measurement K1 Data acquisition K1 Software K1 Silicon SP 1 OP 1 LK http://dx.doi.org/https://doi.org/10.1109/NSSMICRTSD49126.2023.10337858 DO https://doi.org/10.1109/NSSMICRTSD49126.2023.10337858 SF ELIB - SuUB Bremen
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