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1 Ergebnisse
1
The Evolution of ArduSiPM technology : A Compact, Versatile..:
, In:
2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)
,
Bocci, V.
;
Babar, A.
;
Badoni, D.
... - p. 1-2 , 2023
Link:
https://doi.org/10.1109/NSSMICRTSD49126.2023.10337863
RT T1 <cTitle>2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)</cTitle>: T1 <Title>The Evolution of ArduSiPM technology : A Compact, Versatile, and Cost-effective Detector Platform for Radiation and Photon Flux Measurements</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10337863&Exemplar=1&LAN=DE A1 Bocci, V. A1 Babar, A. A1 Badoni, D. A1 Casolino, M. A1 Chiodi, G. A1 Iacoangeli, F. A1 Kubler, D. A1 Marcelli, L. A1 Rebustini, G. A1 Reali, E. A1 Recchia, L. A1 Salvato, M. YR 2023 SN 2577-0829 K1 Weight measurement K1 Semiconductor device measurement K1 Time-frequency analysis K1 Reduced instruction set computing K1 Semiconductor detectors K1 Detectors K1 Throughput SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.1109/NSSMICRTSD49126.2023.10337863 DO https://doi.org/10.1109/NSSMICRTSD49126.2023.10337863 SF ELIB - SuUB Bremen
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