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1 Ergebnisse
1
Enhanced use of contextual data for quantitative Compton im..:
, In:
2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)
,
Knecht, K.
;
Bandstra, M. S.
;
Batie, G.
... - p. 1-1 , 2023
Link:
https://doi.org/10.1109/NSSMICRTSD49126.2023.10337904
RT T1 <cTitle>2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)</cTitle>: T1 <Title>Enhanced use of contextual data for quantitative Compton imaging</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10337904&Exemplar=1&LAN=DE A1 Knecht, K. A1 Bandstra, M. S. A1 Batie, G. A1 Daughhetee, J. D. A1 Folsom, M. A1 Gunter, D. A1 Hellfeld, D. A1 Joshi, T.H.Y. A1 Salathe, M. A1 Schmitt, K. A1 Ziock, K.-P. A1 Vetter, K. YR 2023 SN 2577-0829 K1 Semiconductor device measurement K1 Three-dimensional displays K1 Uncertainty K1 Semiconductor detectors K1 Radiation detectors K1 Data integration K1 Sensor fusion SP 1 OP 1 LK http://dx.doi.org/https://doi.org/10.1109/NSSMICRTSD49126.2023.10337904 DO https://doi.org/10.1109/NSSMICRTSD49126.2023.10337904 SF ELIB - SuUB Bremen
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