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1 Ergebnisse
1
Advanced Photon-Counting Detector Simulator with a Count-Ra..:
, In:
2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)
,
Lee, D.
;
Zhan, X.
;
Tai, W. Y.
.. - p. 1-2 , 2023
Link:
https://doi.org/10.1109/NSSMICRTSD49126.2023.10337981
RT T1 <cTitle>2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)</cTitle>: T1 <Title>Advanced Photon-Counting Detector Simulator with a Count-Rate-Dependent Mapping Operator and a Pixel-to-Pixel Variation Generator</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10337981&Exemplar=1&LAN=DE A1 Lee, D. A1 Zhan, X. A1 Tai, W. Y. A1 Zbijewski, W. A1 Taguchi, K. YR 2023 SN 2577-0829 K1 Semiconductor device measurement K1 Microwave integrated circuits K1 Semiconductor detectors K1 Computed tomography K1 Computational modeling K1 Measurement uncertainty K1 Energy measurement SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.1109/NSSMICRTSD49126.2023.10337981 DO https://doi.org/10.1109/NSSMICRTSD49126.2023.10337981 SF ELIB - SuUB Bremen
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