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1 Ergebnisse
1
Image corrections software using emission data only for ful..:
, In:
2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)
,
Beguin, M.
;
Commichau, V.
;
Flock, J.
... - p. 1-1 , 2023
Link:
https://doi.org/10.1109/NSSMICRTSD49126.2023.10338022
RT T1 <cTitle>2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)</cTitle>: T1 <Title>Image corrections software using emission data only for full and partial ring PET scanners</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10338022&Exemplar=1&LAN=DE A1 Beguin, M. A1 Commichau, V. A1 Flock, J. A1 Fuentes, C. A1 Lomax, A. A1 Makkar, S. A1 McNamara, K. A1 Oddo, M. A1 Prior, J. A1 Ritzer, C. A1 Weber, D. A1 Winterhalter, C. A1 Dissertori, G. YR 2023 SN 2577-0829 K1 Protons K1 Particle beams K1 Microwave integrated circuits K1 Semiconductor detectors K1 Attenuation K1 Software K1 Iterative algorithms SP 1 OP 1 LK http://dx.doi.org/https://doi.org/10.1109/NSSMICRTSD49126.2023.10338022 DO https://doi.org/10.1109/NSSMICRTSD49126.2023.10338022 SF ELIB - SuUB Bremen
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