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1
Investigation of a Next Generation Medical Imaging SiPM Tec..:
, In:
2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)
,
Foster, J. W.
;
Pourashraf, S.
;
Bellis, S.
... - p. 1-1 , 2023
Link:
https://doi.org/10.1109/NSSMICRTSD49126.2023.10338033
RT T1 <cTitle>2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)</cTitle>: T1 <Title>Investigation of a Next Generation Medical Imaging SiPM Technology</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10338033&Exemplar=1&LAN=DE A1 Foster, J. W. A1 Pourashraf, S. A1 Bellis, S. A1 Coughlan, B. A1 Herbert, D. A1 Nagai, A. A1 Barry, C. A1 Levin, C. S. YR 2023 SN 2577-0829 K1 Performance evaluation K1 Semiconductor device measurement K1 Energy resolution K1 Measurement uncertainty K1 Energy measurement K1 Optical variables measurement K1 Positron emission tomography SP 1 OP 1 LK http://dx.doi.org/https://doi.org/10.1109/NSSMICRTSD49126.2023.10338033 DO https://doi.org/10.1109/NSSMICRTSD49126.2023.10338033 SF ELIB - SuUB Bremen
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