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1 Ergebnisse
1
Digital Pulse Processing and Pile-up Correction in NaI(Tl) ..:
, In:
2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)
,
Bae, J.
;
Graham, C.
;
Meert, C.
... - p. 1-1 , 2023
Link:
https://doi.org/10.1109/NSSMICRTSD49126.2023.10338034
RT T1 <cTitle>2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)</cTitle>: T1 <Title>Digital Pulse Processing and Pile-up Correction in NaI(Tl) for Neutron Active Interrogation</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10338034&Exemplar=1&LAN=DE A1 Bae, J. A1 Graham, C. A1 Meert, C. A1 Jinia, A. A1 Clarke, S. A1 Pozzi, S. A. A1 Jovanovic, I. YR 2023 SN 2577-0829 K1 Maximum likelihood estimation K1 Spectroscopy K1 Semiconductor device measurement K1 Phase measurement K1 Semiconductor detectors K1 Gamma-rays K1 Neutrons SP 1 OP 1 LK http://dx.doi.org/https://doi.org/10.1109/NSSMICRTSD49126.2023.10338034 DO https://doi.org/10.1109/NSSMICRTSD49126.2023.10338034 SF ELIB - SuUB Bremen
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