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Characterization of a 5mm thick CdTe photon-counting detect..:
, In:
2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)
,
Useche, S. J.
;
Roque, G. A.
;
Schutz, M. K.
.. - p. 1-1 , 2023
Link:
https://doi.org/10.1109/NSSMICRTSD49126.2023.10338101
RT T1 <cTitle>2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)</cTitle>: T1 <Title>Characterization of a 5mm thick CdTe photon-counting detector: Advancing nuclear decommissioning with Compton camera technology</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10338101&Exemplar=1&LAN=DE A1 Useche, S. J. A1 Roque, G. A. A1 Schutz, M. K. A1 Fiederle, M. A1 Procz, S. YR 2023 SN 2577-0829 K1 Semiconductor device measurement K1 Sensitivity K1 II-VI semiconductor materials K1 Semiconductor detectors K1 Scattering K1 Cameras K1 Recycling SP 1 OP 1 LK http://dx.doi.org/https://doi.org/10.1109/NSSMICRTSD49126.2023.10338101 DO https://doi.org/10.1109/NSSMICRTSD49126.2023.10338101 SF ELIB - SuUB Bremen
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