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1 Ergebnisse
1
Sensor for Displacement Damage Monitoring in GCR Space Envi..:
, In:
2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)
,
Bennett, D.
;
Tran, L. T.
;
Pan, V.
... - p. 1-1 , 2023
Link:
https://doi.org/10.1109/NSSMICRTSD49126.2023.10338140
RT T1 <cTitle>2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)</cTitle>: T1 <Title>Sensor for Displacement Damage Monitoring in GCR Space Environment</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10338140&Exemplar=1&LAN=DE A1 Bennett, D. A1 Tran, L. T. A1 Pan, V. A1 Bolst, D. A1 Vohradsky, J. A1 Petasecca, M. A1 Guatelli, S. A1 Lerch, M. A1 Aoki, K. A1 Nakaji, T. A1 Mizuno, H. A1 Inaniwa, T. A1 Perevertaylo, A. A1 Anokhin, I. E. A1 Rosenfeld, A. B. YR 2023 SN 2577-0829 K1 Semiconductor device measurement K1 Microwave integrated circuits K1 Semiconductor detectors K1 Space missions K1 Photovoltaic cells K1 Ions K1 Time measurement SP 1 OP 1 LK http://dx.doi.org/https://doi.org/10.1109/NSSMICRTSD49126.2023.10338140 DO https://doi.org/10.1109/NSSMICRTSD49126.2023.10338140 SF ELIB - SuUB Bremen
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