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Imaging Performance of the Fully Assembled Ultra-High Resol..:

, In: 2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD),

Loignon-Houle, F. ; Toussaint, M. ; Beaudoin, J.-F.... - p. 1-1 , 2023

Link: https://doi.org/10.1109/NSSMICRTSD49126.2023.10338146

RT 
T1 <cTitle>2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)</cTitle>: T1 <Title>Imaging Performance of the Fully Assembled Ultra-High Resolution (UHR) Brain PET scanner</Title>

UL https://suche.suub.uni-bremen.de/peid=ieee-10338146&Exemplar=1&LAN=DE
				
A1 Loignon-Houle, F.
A1 Toussaint, M.
A1 Beaudoin, J.-F.
A1 Gaudreault, M.
A1 Doyon, V.
A1 Leroux, J.-D.
A1 Auger, E.
A1 Thibaudeau, C.
A1 Arpin, L.
A1 Croteau, E.
A1 Espinosa-Bentancourt, E.
A1 Samson, A.
A1 Bouchard, J.
A1 Espagnet, R.
A1 Viscogliosi, N.
A1 Pepin, C. M.
A1 Labrecque, V.
A1 Paulin, C.
A1 Marin, T.
A1 Ouyang, J.
A1 Normandin, M.
A1 Tetrault, M.-A.
A1 Michaud, J.-B.
A1 Fontaine, R.
A1 El Fakhri, G.
A1 Lecomte, R.
YR 2023
SN 2577-0829
K1 Image quality
K1 Semiconductor device measurement
K1 Three-dimensional displays
K1 Semiconductor detectors
K1 Volume measurement
K1 Phantoms
K1 Object recognition
SP 1
OP 1
LK http://dx.doi.org/https://doi.org/10.1109/NSSMICRTSD49126.2023.10338146
DO https://doi.org/10.1109/NSSMICRTSD49126.2023.10338146
SF ELIB - SuUB Bremen

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