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Normalization and scatter corrections for the J-PET scanner:

, In: 2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD),

Coussat, A. ; Krzemien, W. ; Baran, J.... - p. 1-2 , 2023

Link: https://doi.org/10.1109/NSSMICRTSD49126.2023.10338155

RT 
T1 <cTitle>2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)</cTitle>: T1 <Title>Normalization and scatter corrections for the J-PET scanner</Title>

UL https://suche.suub.uni-bremen.de/peid=ieee-10338155&Exemplar=1&LAN=DE
				
A1 Coussat, A.
A1 Krzemien, W.
A1 Baran, J.
A1 Parzych, S.
A1 Raczynski, L.
A1 Chug, N.
A1 Curceanu, C.
A1 Czerwinski, E.
A1 Dadgar, M.
A1 Dulski, K.
A1 Gajewski, J.
A1 Hiesmayr, B.
A1 Eliyan, K. Valsan
A1 Jedruszczak, A.
A1 Kacprzak, K.
A1 Gajos, A.
A1 Kaplanoglu, T.
A1 Kaplon, L.
A1 Klimaszewski, K.
A1 Kozik, T.
A1 Lapkiewicz, G.
A1 Korcyl, G.
A1 Moyo, S.
A1 Kumar, D.
A1 Mryka, W.
A1 Niedzwiecki, S.
A1 Sharma, S.
A1 Del Rio, E. Perez
A1 Shivani, S.
A1 Shopa, R.
A1 Tanty, P.
A1 Skurzok, M.
A1 Tayefi, K.
A1 Tayefi, F.
A1 Stepien, E.
A1 Wislicki, W.
A1 Moskal, P.
YR 2023
SN 2577-0829
K1 Image quality
K1 Microwave integrated circuits
K1 Monte Carlo methods
K1 Semiconductor detectors
K1 Prototypes
K1 Phantoms
K1 Positron emission tomography
SP 1
OP 2
LK http://dx.doi.org/https://doi.org/10.1109/NSSMICRTSD49126.2023.10338155
DO https://doi.org/10.1109/NSSMICRTSD49126.2023.10338155
SF ELIB - SuUB Bremen

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