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1 Ergebnisse
1
New spectrometer dedicated to metrological characterization..:
, In:
2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)
,
Thiam, C.
;
Carrel, F.
;
Hamel, M.
... - p. 1-1 , 2023
Link:
https://doi.org/10.1109/NSSMICRTSD49126.2023.10338196
RT T1 <cTitle>2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)</cTitle>: T1 <Title>New spectrometer dedicated to metrological characterization of radionuclide-based neutron sources</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10338196&Exemplar=1&LAN=DE A1 Thiam, C. A1 Carrel, F. A1 Hamel, M. A1 Frangville, C. A1 Bertrand, G. A1 Bobin, C. A1 Lepy, M.-C. A1 Sabot, B. A1 Trocme, M. A1 Makil, H. A1 Elayeb, A. YR 2023 SN 2577-0829 K1 Semiconductor device measurement K1 Spirals K1 Shape K1 Shape measurement K1 Signal processing algorithms K1 Neutrons K1 Containers SP 1 OP 1 LK http://dx.doi.org/https://doi.org/10.1109/NSSMICRTSD49126.2023.10338196 DO https://doi.org/10.1109/NSSMICRTSD49126.2023.10338196 SF ELIB - SuUB Bremen
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