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1 Ergebnisse
1
TlBr Films for Hard X-Ray Imaging:
, In:
2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)
,
Squillante, M.
;
Breen, M. J.
;
Kargar, A.
... - p. 1-1 , 2023
Link:
https://doi.org/10.1109/NSSMICRTSD49126.2023.10338218
RT T1
2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)
: T1
TlBr Films for Hard X-Ray Imaging
UL https://suche.suub.uni-bremen.de/peid=ieee-10338218&Exemplar=1&LAN=DE A1 Squillante, M. A1 Breen, M. J. A1 Kargar, A. A1 Christian, J. F. A1 Squillante, M. A1 Maksimov, O. A1 Battacharya, P. A1 Cirignano, L. J. A1 Ogorodnik, Y. A1 Pinaroli, G. A1 Fuchs, M. R. A1 Tremsin, A. S. A1 Karim, K. S. A1 Scott, C. C. A1 Nagarkar, V. V. YR 2023 SN 2577-0829 K1 Thallium K1 Microwave integrated circuits K1 X-ray detectors K1 II-VI semiconductor materials K1 Semiconductor detectors K1 Films K1 Crystals SP 1 OP 1 LK http://dx.doi.org/https://doi.org/10.1109/NSSMICRTSD49126.2023.10338218 DO https://doi.org/10.1109/NSSMICRTSD49126.2023.10338218 SF ELIB - SuUB Bremen
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