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1 Ergebnisse
1
A Comparison of Voltage-Mode and Time-Based Timing and Ener..:
, In:
2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)
,
Lusardi, N.
;
Garzetti, F.
;
Ronconi, E.
... - p. 1-1 , 2023
Link:
https://doi.org/10.1109/NSSMICRTSD49126.2023.10338229
RT T1 <cTitle>2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)</cTitle>: T1 <Title>A Comparison of Voltage-Mode and Time-Based Timing and Energy Read-Out Circuits</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10338229&Exemplar=1&LAN=DE A1 Lusardi, N. A1 Garzetti, F. A1 Ronconi, E. A1 Costa, A. A1 Bonanno, G. A1 Bernasconi, L. A1 Geraci, A. YR 2023 SN 2577-0829 K1 Semiconductor device measurement K1 Microwave integrated circuits K1 Semiconductor detectors K1 Printed circuits K1 Energy measurement K1 Programmable logic arrays K1 Logic gates SP 1 OP 1 LK http://dx.doi.org/https://doi.org/10.1109/NSSMICRTSD49126.2023.10338229 DO https://doi.org/10.1109/NSSMICRTSD49126.2023.10338229 SF ELIB - SuUB Bremen
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