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1
High throughput X-ray Polarimetry with a new custom ASIC co..:
, In:
2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)
,
Minuti, M.
;
Sgro, C.
;
Baldini, L.
... - p. 1-1 , 2023
Link:
https://doi.org/10.1109/NSSMICRTSD49126.2023.10338273
RT T1 <cTitle>2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)</cTitle>: T1 <Title>High throughput X-ray Polarimetry with a new custom ASIC coupled to an electron multiplier of novel type</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10338273&Exemplar=1&LAN=DE A1 Minuti, M. A1 Sgro, C. A1 Baldini, L. A1 Latronico, L. A1 Bellazzini, R. A1 Pesce-Rollins, M. A1 Lucchesi, L. A1 Orsini, L. A1 Pinchera, M. A1 Spandre, G. A1 Brez, A. A1 Ceccanti, M. A1 Profeti, A. A1 Manfreda, A. YR 2023 SN 2577-0829 K1 Q-factor K1 Semiconductor device measurement K1 Microwave integrated circuits K1 Semiconductor detectors K1 Electron multipliers K1 Throughput K1 Extraterrestrial measurements SP 1 OP 1 LK http://dx.doi.org/https://doi.org/10.1109/NSSMICRTSD49126.2023.10338273 DO https://doi.org/10.1109/NSSMICRTSD49126.2023.10338273 SF ELIB - SuUB Bremen
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