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1 Ergebnisse
1
Excess noise and spectra distortion in pulsed-reset charge ..:
, In:
2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)
,
Quercia, J.
;
Mele, F.
;
Bertuccio, G.
- p. 1-1 , 2023
Link:
https://doi.org/10.1109/NSSMICRTSD49126.2023.10338322
RT T1
2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)
: T1
Excess noise and spectra distortion in pulsed-reset charge sensitive amplifiers due to non-stationary gain: analytical model and Monte Carlo simulations
UL https://suche.suub.uni-bremen.de/peid=ieee-10338322&Exemplar=1&LAN=DE A1 Quercia, J. A1 Mele, F. A1 Bertuccio, G. YR 2023 SN 2577-0829 K1 Analytical models K1 Semiconductor device measurement K1 Microwave integrated circuits K1 Voltage measurement K1 Monte Carlo methods K1 Semiconductor detectors K1 Pulse measurements SP 1 OP 1 LK http://dx.doi.org/https://doi.org/10.1109/NSSMICRTSD49126.2023.10338322 DO https://doi.org/10.1109/NSSMICRTSD49126.2023.10338322 SF ELIB - SuUB Bremen
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