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1 Ergebnisse
1
Absolute light yield measurement of various NaI:Tl crystal ..:
, In:
2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)
,
Kim, H.J.
;
Nguyen, L. T.
;
Jin, J.
... - p. 1-1 , 2023
Link:
https://doi.org/10.1109/NSSMICRTSD49126.2023.10338452
RT T1 <cTitle>2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)</cTitle>: T1 <Title>Absolute light yield measurement of various NaI:Tl crystal scintillators</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10338452&Exemplar=1&LAN=DE A1 Kim, H.J. A1 Nguyen, L. T. A1 Jin, J. A1 Khan, A. A1 Nguyen, T. D. A1 Lam, T. T. A1 Park, H.B. A1 Kim, S.H. A1 Lee, H.S. YR 2023 SN 2577-0829 K1 Semiconductor device measurement K1 Biomedical optical imaging K1 Systematics K1 Semiconductor detectors K1 Crystals K1 US Department of Homeland Security K1 Optical imaging SP 1 OP 1 LK http://dx.doi.org/https://doi.org/10.1109/NSSMICRTSD49126.2023.10338452 DO https://doi.org/10.1109/NSSMICRTSD49126.2023.10338452 SF ELIB - SuUB Bremen
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