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1 Ergebnisse
1
Deep Learning Image Denoising in PET: Quantitative Impact o..:
, In:
2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)
,
Muller, F.
;
Li, E.
;
Gao, M.
... - p. 1-1 , 2023
Link:
https://doi.org/10.1109/NSSMICRTSD49126.2023.10338459
RT T1 <cTitle>2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)</cTitle>: T1 <Title>Deep Learning Image Denoising in PET: Quantitative Impact on Kinetic Modeling and Clinical Metrics</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10338459&Exemplar=1&LAN=DE A1 Muller, F. A1 Li, E. A1 Gao, M. A1 Pantel, A. A1 Parma, M. A1 Surti, S. A1 Vanhove, C. A1 Vandenberghe, S. A1 Daube-Witherspoon, M. E. A1 Karp, J. S. YR 2023 SN 2577-0829 K1 Deep learning K1 Solid modeling K1 Semiconductor device measurement K1 Protocols K1 Sensitivity K1 Semiconductor detectors K1 Noise reduction SP 1 OP 1 LK http://dx.doi.org/https://doi.org/10.1109/NSSMICRTSD49126.2023.10338459 DO https://doi.org/10.1109/NSSMICRTSD49126.2023.10338459 SF ELIB - SuUB Bremen
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