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1 Ergebnisse
1
Impact of the ADC Nonlinearities on X-ray Spectral Analysis..:
, In:
2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)
,
Castoldi, A.
;
Ghisetti, M.
;
Guazzoni, C.
... - p. 1-1 , 2023
Link:
https://doi.org/10.1109/NSSMICRTSD49126.2023.10338469
RT T1
2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)
: T1
Impact of the ADC Nonlinearities on X-ray Spectral Analysis and Correction Techniques
UL https://suche.suub.uni-bremen.de/peid=ieee-10338469&Exemplar=1&LAN=DE A1 Castoldi, A. A1 Ghisetti, M. A1 Guazzoni, C. A1 Danilevski, C. A1 Lomidze, D. A1 Porro, M. YR 2023 SN 2577-0829 K1 Semiconductor device measurement K1 Microwave integrated circuits K1 Semiconductor detectors K1 Fitting K1 Market research K1 High dynamic range K1 Noise measurement SP 1 OP 1 LK http://dx.doi.org/https://doi.org/10.1109/NSSMICRTSD49126.2023.10338469 DO https://doi.org/10.1109/NSSMICRTSD49126.2023.10338469 SF ELIB - SuUB Bremen
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