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1 Ergebnisse
1
Automatic determination algorithm of intrinsic parameters o..:
, In:
2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)
,
Lee, C.
;
Hayashi, H.
;
Kobayashi, D.
... - p. 1-1 , 2023
Link:
https://doi.org/10.1109/NSSMICRTSD49126.2023.10338477
RT T1 <cTitle>2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)</cTitle>: T1 <Title>Automatic determination algorithm of intrinsic parameters on response function of energy-resolving photon counting imaging detector</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10338477&Exemplar=1&LAN=DE A1 Lee, C. A1 Hayashi, H. A1 Kobayashi, D. A1 Nishigami, R. A1 Maeda, T. A1 Asahara, T. A1 Kanazawa, Y. A1 Katsumata, A. A1 Kimoto, N. A1 Yamamoto, S. YR 2023 SN 2577-0829 K1 Radiography K1 Semiconductor device measurement K1 Statistical analysis K1 Aluminum K1 Phantoms K1 Detectors K1 Approximation algorithms SP 1 OP 1 LK http://dx.doi.org/https://doi.org/10.1109/NSSMICRTSD49126.2023.10338477 DO https://doi.org/10.1109/NSSMICRTSD49126.2023.10338477 SF ELIB - SuUB Bremen
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