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The new Matterhorn detector for 4th generation synchrotrons:

, In: 2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD),

Mezza, D. ; Barten, R. ; Baruffaldi, F.... - p. 1-1 , 2023

Link: https://doi.org/10.1109/NSSMICRTSD49126.2023.10338514

RT 
T1 <cTitle>2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)</cTitle>: T1 <Title>The new Matterhorn detector for 4th generation synchrotrons</Title>

UL https://suche.suub.uni-bremen.de/peid=ieee-10338514&Exemplar=1&LAN=DE
				
A1 Mezza, D.
A1 Barten, R.
A1 Baruffaldi, F.
A1 Bergamaschi, A.
A1 Brueckner, M.
A1 Carulla, M.
A1 Dinapoli, R.
A1 Ebner, S.
A1 Froejd, E.
A1 Greiffenberg, D.
A1 Hasanaj, S.
A1 Heymes, J.
A1 Hinger, V.
A1 King, T.
A1 Kozlowski, P.
A1 Lopez-Cuenca, C.
A1 Mozzanica, A.
A1 Moustakas, K.
A1 Paton, K. A.
A1 Ruder, C.
A1 Schmitt, B.
A1 Thattil, D.
A1 Xie, X.
A1 Zhang, J.
YR 2023
SN 2577-0829
K1 Microwave integrated circuits
K1 Semiconductor detectors
K1 Synchrotrons
K1 Prototypes
K1 Detectors
K1 Storage rings
K1 System-on-chip
SP 1
OP 1
LK http://dx.doi.org/https://doi.org/10.1109/NSSMICRTSD49126.2023.10338514
DO https://doi.org/10.1109/NSSMICRTSD49126.2023.10338514
SF ELIB - SuUB Bremen

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