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1 Ergebnisse
1
Vibration Correction for Slot-Scanning Dark-Field X-Ray Ima..:
, In:
2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)
,
Noichl, W.
;
De Marco, F.
;
Schick, R.
... - p. 1-1 , 2023
Link:
https://doi.org/10.1109/NSSMICRTSD49126.2023.10338543
RT T1 <cTitle>2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)</cTitle>: T1 <Title>Vibration Correction for Slot-Scanning Dark-Field X-Ray Imaging</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10338543&Exemplar=1&LAN=DE A1 Noichl, W. A1 De Marco, F. A1 Schick, R. A1 Hehn, L. A1 Maack, I. A1 Pfeiffer, F. A1 Koehler, T. YR 2023 SN 2577-0829 K1 Vibrations K1 Semiconductor device modeling K1 Microwave integrated circuits K1 Maximum likelihood detection K1 Costs K1 Semiconductor detectors K1 Data models SP 1 OP 1 LK http://dx.doi.org/https://doi.org/10.1109/NSSMICRTSD49126.2023.10338543 DO https://doi.org/10.1109/NSSMICRTSD49126.2023.10338543 SF ELIB - SuUB Bremen
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