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Investigation of the SOI microdosimeter for high LET ion me..:

, In: 2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD),
Vohradsky, J. ; Pan, V. ; Bennett, D.... - p. 1-1 , 2023
Link: https://doi.org/10.1109/NSSMICRTSD49126.2023.10338627