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1
Automatic Scaphoid Fracture Detection in Radiography by aid..:
, In:
2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)
,
Hajianfar, G.
;
Bagheri, S.
;
Gharibi, O.
... - p. 1-1 , 2023
Link:
https://doi.org/10.1109/NSSMICRTSD49126.2023.10338659
RT T1 <cTitle>2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)</cTitle>: T1 <Title>Automatic Scaphoid Fracture Detection in Radiography by aid of Interpretable Deep Learning</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10338659&Exemplar=1&LAN=DE A1 Hajianfar, G. A1 Bagheri, S. A1 Gharibi, O. A1 Mousavi, S.A. A1 Aminzadeh, B. A1 Sabouri, M. A1 Shiri, I. A1 Zaidi, H. YR 2023 SN 2577-0829 K1 Radiography K1 Semiconductor device modeling K1 Training K1 Deep learning K1 Microwave integrated circuits K1 Sensitivity K1 Semiconductor detectors SP 1 OP 1 LK http://dx.doi.org/https://doi.org/10.1109/NSSMICRTSD49126.2023.10338659 DO https://doi.org/10.1109/NSSMICRTSD49126.2023.10338659 SF ELIB - SuUB Bremen
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