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1
On-beam Qualification of the First Depfet Ladder of the DSS..:
, In:
2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)
,
Castoldi, A.
;
Ghisetti, M.
;
Guazzoni, C.
... - p. 1-1 , 2023
Link:
https://doi.org/10.1109/NSSMICRTSD49126.2023.10338681
RT T1 <cTitle>2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)</cTitle>: T1 <Title>On-beam Qualification of the First Depfet Ladder of the DSSC X-ray Imager</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10338681&Exemplar=1&LAN=DE A1 Castoldi, A. A1 Ghisetti, M. A1 Guazzoni, C. A1 Aschauer, S. A1 Strueder, L. W.J. A1 Hansen, K. A1 Maffessanti, S. A1 Ovcharenko, Y. A1 Baumann, T. A1 Danilevski, C. A1 Dourki, I. A1 Guyader, L. Le A1 Maltezopoulos, T. A1 Lomidze, D. A1 Porro, M. YR 2023 SN 2577-0829 K1 Semiconductor device measurement K1 Microwave integrated circuits K1 Maximum likelihood detection K1 Semiconductor detectors K1 Power distribution K1 X-rays K1 Nonlinear filters SP 1 OP 1 LK http://dx.doi.org/https://doi.org/10.1109/NSSMICRTSD49126.2023.10338681 DO https://doi.org/10.1109/NSSMICRTSD49126.2023.10338681 SF ELIB - SuUB Bremen
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