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The Sensitivity of Exponential Data Consistency Condition-b..:

, In: 2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD),
Clark, T. ; Clackdoyle, R. ; Wells, R. G. - p. 1-1 , 2023
Link: https://doi.org/10.1109/NSSMICRTSD49126.2023.10338760