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1 Ergebnisse
1
Experimental Verification of Prompt Gamma Imaging Technique..:
, In:
2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)
,
Idrissi, A. Bourkadi
;
Borghi, G.
;
Donetti, M.
... - p. 1-1 , 2023
Link:
https://doi.org/10.1109/NSSMICRTSD49126.2023.10338794
RT T1 <cTitle>2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)</cTitle>: T1 <Title>Experimental Verification of Prompt Gamma Imaging Technique during Carbon Ion Radiation Therapy</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10338794&Exemplar=1&LAN=DE A1 Idrissi, A. Bourkadi A1 Borghi, G. A1 Donetti, M. A1 Pullia, M. A1 Missaglia, A. A1 Casamichiela, F. A1 Mazzucconi, D. A1 Camera, F. A1 Carminati, M. A1 Agosteo, S. A1 Fiorini, C. E. YR 2023 SN 2577-0829 K1 Image quality K1 Semiconductor device measurement K1 Particle beams K1 Sensitivity K1 Semiconductor detectors K1 Simulation K1 Crystals SP 1 OP 1 LK http://dx.doi.org/https://doi.org/10.1109/NSSMICRTSD49126.2023.10338794 DO https://doi.org/10.1109/NSSMICRTSD49126.2023.10338794 SF ELIB - SuUB Bremen
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