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1
Opportunities and limitations of pure Cherenkov TOF PET sca..:
, In:
2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)
,
Razdevsekc, G.
;
Dolenec, R.
;
Pestotnik, R.
... - p. 1-1 , 2023
Link:
https://doi.org/10.1109/NSSMICRTSD49126.2023.10338809
RT T1 <cTitle>2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)</cTitle>: T1 <Title>Opportunities and limitations of pure Cherenkov TOF PET scanners</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10338809&Exemplar=1&LAN=DE A1 Razdevsekc, G. A1 Dolenec, R. A1 Pestotnik, R. A1 Krizan, P. A1 Rodriguez, D. Consuegra A1 Seljak, A. A1 Studen, A. A1 Orehar, M. A1 Korpar, S. YR 2023 SN 2577-0829 K1 Image quality K1 Microwave integrated circuits K1 Monte Carlo methods K1 Limiting K1 Semiconductor detectors K1 Logic gates K1 Software SP 1 OP 1 LK http://dx.doi.org/https://doi.org/10.1109/NSSMICRTSD49126.2023.10338809 DO https://doi.org/10.1109/NSSMICRTSD49126.2023.10338809 SF ELIB - SuUB Bremen
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